Imaging of Individual Eu Doped Y2O3 Sub-microspheres Using Photoluminescence Yield: An Application of Scanning Transmission X-ray Microscopy in Luminescent Materials
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Luminescence Properties of Advanced Materials · Ga2O3 and related materials · Silicon Nanostructures and Photoluminescence
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References (8)
Show source-provided references
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