Stable and Flexible Side-Entry Stage for Nion STEMs
Source abstract
Abstract
Michael T Hotz, George Corbin, Niklas Delby, Tracy C Lovejoy, Gwyn Skone, Jean-Denis Blazit, Mathieu Kociak, Odile Stephan, Marcel Tencé, Henny W Zandberge
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. 10.1017/S143192761005696510.1017/S1431927610056965 ↗
2. 10.1016/j.ultramic.2007.07.01010.1016/j.ultramic.2007.07.010 ↗
3. 10.1038/nature1387010.1038/nature13870 ↗
4. Kociak · Ultramicroscopy · 2017 · 174 · 5010.1016/j.ultramic.2016.11.018 ↗