Progress in X-ray Mapping in Electron Microscopes Toward Single-Atom Analysis
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Abstract
Journal Article Progress in X-ray Mapping in Electron Microscopes Toward Single-Atom Analysis Get access M Watanabe M Watanabe Dept of Materials Science and Engineering, Lehigh University, Bethlehem. PA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 1014–1015, https://doi.org/10.1017/S1431927617005736 Published: 04 August 2017
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Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques
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References (10)
Show source-provided references
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4. The author wishes to acknowledge financial support from the NSF through grants DMR-0804528 and DMR-1040229, and would like to thank to Dr. Peter Duncumb for providing useful information and reviewing this paper..
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