Defect Characterization in Irradiated Nanocrystalline Materials via Automated Crystal Orientation Mapping
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Abstract
Pranav K Suri, James E Nathaniel, Christopher M Barr, Jon K Baldwin, Khalid Hattar, Mitra L Taheri; Defect Characterization in Irradiated Nanocrystalline M
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Ion-surface interactions and analysis · Nuclear materials and radiation effects · Advanced X-ray and CT Imaging
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References (7)
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5. This work at the Drexel University is supported by the United States Department of Energy, Basic Energy Sciences under the Early Career program through contract DE-SC0008274. This work was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science. Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-AC04-94AL85000.
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