RISE - Raman SEM Imaging of Single Layer and Twisted Bilayer Graphene

Ute Schmidt; Hans Zimmermann; Stefanie Freitag; Thomas Dieing

doi:10.1017/s1431927617009400

journal article·2017-07Open access

RISE - Raman SEM Imaging of Single Layer and Twisted Bilayer Graphene

Ute Schmidt, Hans Zimmermann, Stefanie Freitag, Thomas Dieing

Microscopy and Microanalysis· Volume 23· Issue S1

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Abstract

Ute Schmidt, Hans Zimmermann, Stefanie Freitag, Thomas Dieing; RISE - Raman SEM Imaging of Single Layer and Twisted Bilayer Graphene, Microscopy and Microa

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Source: openalex_inverted_index · Quality: short

Research context

Nanomaterials

OpenAlex topics: Graphene research and applications · Graphene and Nanomaterials Applications · Carbon Nanotubes in Composites

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (5)

Show source-provided references

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