journal article·2017-07Open access

Under-sampling and Image Reconstruction for Scanning Electron Microscopes

Yan Zhang, G.M. Dilshan Godaliyadda, Youssef S. G. Nashed, Nicola Ferrier, Emine Begum Gulsoy, Charudatta Phatak

Microscopy and Microanalysis· Volume 23· Issue S1

Abstract

Yan Zhang, GM Dilshan Godaliyadda, Youssef S G Nashed, Nicola Ferrier, Emine Begum Gulsoy, Charudatta Phatak; Under-sampling and Image Reconstruction for S
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Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis

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References (6)

Show source-provided references
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2. 10.1093/jmicro/dft04210.1093/jmicro/dft042 ↗
3. Sang · Advanced Structural and Chemical Imaging · 2016 · 2 · 110.1186/s40679-016-0020-3 ↗
4. Convolutional deep belief networks on cifar-10
5. The authors acknowledge funding from Laboratory-Directed Research and Development (LDRD) at Argonne National Laboratory. SEM images are collected with Dr. Lee Makowski at Northeastern University.
6. 10.1038/srep0375610.1038/srep03756 ↗