Fundamental limit to single-atom analysis by STEM-EDX spectroscopy

M. Watanabe; R.F. Egerton

doi:10.1017/s1431927617002586

journal article·2017-07Open access

Fundamental limit to single-atom analysis by STEM-EDX spectroscopy

M. Watanabe, R.F. Egerton

Microscopy and Microanalysis· Volume 23· Issue S1

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Abstract

M Watanabe, RF Egerton; Fundamental limit to single-atom analysis by STEM-EDX spectroscopy, Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017,

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · Ion-surface interactions and analysis

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References (9)

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3. MW wishes to acknowledge financial support from the NSF through grants DMR-0804528 and DMR-1040229. RFE is grateful to NSERC for funding.

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