A Convolutional Neural Network Approach to Thickness Determination using Position Averaged Convergent Beam Electron Diffraction
Source abstract
Abstract
Weizong Xu, James M LeBeau; A Convolutional Neural Network Approach to Thickness Determination using Position Averaged Convergent Beam Electron Diffraction
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Domain Adaptation and Few-Shot Learning · Machine Learning and ELM · Machine Learning in Materials Science
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (5)
Show source-provided references
1. Srivastava · Journal of Machine Learning Research · 2014 · 15 · 1929
2. Krizhevsky · Advances in Neural Information Processing Systems · 2012 · 25 · 1097
3. The authors acknowledge the support from the National Science Foundation (NSF) (DMR-1350273, DMR-1151568) and Air Force Office of Scientific Research (FA9550-14-1-0182). We thank analytical Instrumentation Facility (AIF) at North Carolina State University supported by the State of North Carolina, the National Science Foundation (ECCS-1542015) and the North Carolina Research Triangle Nanotechnology Network from the National Nanotechnology Coordinated Infrastructure..
4. 10.1109/TKDE.2009.19110.1109/TKDE.2009.191 ↗
5. 10.1016/j.ultramic.2009.10.00110.1016/j.ultramic.2009.10.001 ↗