G-mode - Full Information Capture Applied to Scanning Probe Microscopy
Source abstract
Abstract
Suhas Somnath, Sergei V Kalinin, Stephen Jesse; G-mode - Full Information Capture Applied to Scanning Probe Microscopy, Microscopy and Microanalysis, Volum
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Near-Field Optical Microscopy · Integrated Circuits and Semiconductor Failure Analysis
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References (3)
Show source-provided references
1. 10.1063/1.221469910.1063/1.2214699 ↗
2. This research was conducted at the Center for Nanophase Materials Sciences, which is a DOE office of Science User Facility.
3. 10.1111/j.1551-2916.2009.03240.x10.1111/j.1551-2916.2009.03240.x ↗