Near Shadowless EDS Tomography for Sliced Sample Realized by X-ray Collection with One Large Sized SDD Detector

Yoshitaka Aoyama; Ichiro Ohnishi; Eiji Okunishi; Noriaki Endo; Takeo Sasaki; Yorinobu Iwasawa; Yukihito Kondo

doi:10.1017/s1431927617006080

journal article·2017-07Open access

Near Shadowless EDS Tomography for Sliced Sample Realized by X-ray Collection with One Large Sized SDD Detector

Yoshitaka Aoyama, Ichiro Ohnishi, Eiji Okunishi, Noriaki Endo, Takeo Sasaki, Yorinobu Iwasawa, Yukihito Kondo

Microscopy and Microanalysis· Volume 23· Issue S1

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Abstract

Yoshitaka Aoyama, Ichiro Ohnishi, Eiji Okunishi, Noriaki Endo, Takeo Sasaki, Yorinobu Iwasawa, Yukihito Kondo; Near Shadowless EDS Tomography for Sliced Sa

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · Advanced Electron Microscopy Techniques and Applications

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References (2)

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1. 10.1016/S0304-3991(03)00106-210.1016/S0304-3991(03)00106-2 ↗

2. 10.1017/S143192761600244010.1017/S1431927616002440 ↗