High-Contrast Visualization of Anti-Phase Domains and Screw Dislocations in 3C-SiC
Source abstract
Abstract
Tomoko Borsa, Ryan Brow, Hannah Robinson, Bart Van Zeghbroeck; High-Contrast Visualization of Anti-Phase Domains and Screw Dislocations in 3C-SiC, Microsco
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Silicon Carbide Semiconductor Technologies · Integrated Circuits and Semiconductor Failure Analysis · Silicon and Solar Cell Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (7)
Show source-provided references
1. 10.1063/1.304222410.1063/1.3042224 ↗
2. 10.4028/www.scientific.net/MSF.457-460.38710.4028/www.scientific.net/MSF.457-460.387 ↗
3. 10.1017/S143192761501156310.1017/S1431927615011563 ↗
4. 10.1016/j.apsusc.2015.09.09010.1016/j.apsusc.2015.09.090 ↗
5. 10.1063/1.34160810.1063/1.341608 ↗
6. Hens P. , et al. MRS Advances (2017) [Published online, https://doi.org/10.1557/adv.2017.20].10.1557/adv.2017.20 ↗
7. 10.1093/jmicro/dfh07510.1093/jmicro/dfh075 ↗