Low Accelerating Voltage Scanning Transmitted Electron Microscope: Imaging, Diffraction, X-ray Microanalysis, and Electron Energy-Loss Spectroscopy at the Nanoscale
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Abstract
Hendrix Demers, Nicolas Brodusch, Raynald Gauvin; Low Accelerating Voltage Scanning Transmitted Electron Microscope: Imaging, Diffraction, X-ray Microanaly
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · Surface and Thin Film Phenomena
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References (6)
Show source-provided references
1. Van Ngo · Microscopy Today · 2007 · 15 · 1210.1017/S1551929500050951 ↗
2. 10.1017/S143192761600110010.1017/S1431927616001100 ↗
3. 10.1017/S143192761600387110.1017/S1431927616003871 ↗
4. 10.1016/j.ultramic.2013.09.00110.1016/j.ultramic.2013.09.001 ↗
5. This work was supported by Hitachi High-Technologies Canada Inc.
6. 10.1111/jmi.1214310.1111/jmi.12143 ↗