Nye Tensor Dislocation Density Mapping From Precession Electron Diffraction: Effects of Filtering and Angular Resolution

A.C. Leff; C.R. Weinberger; M.L. Taheri

doi:10.1017/s1431927615010247

journal article·2015-08Open access

Nye Tensor Dislocation Density Mapping From Precession Electron Diffraction: Effects of Filtering and Angular Resolution

A.C. Leff, C.R. Weinberger, M.L. Taheri

Microscopy and Microanalysis· Volume 21· Issue S3

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Abstract

AC Leff, CR Weinberger, ML Taheri; Nye Tensor Dislocation Density Mapping From Precession Electron Diffraction: Effects of Filtering and Angular Resolution

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Microstructure and mechanical properties

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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