DataVXMicroscopy and MicroanalysisPaper
journal article·2016-07

Learning From Scanning Transmission Electron Microscopy to Enhance Transmission X-ray Microscopy: How We Can Merge STEM and TXM Datasets?

X. Yang, D. Gürsoy, C. Phatak, V. De Andrade, E. B. Gulsoy, F. De Carlo

Microscopy and Microanalysis· Volume 22· Issue S3
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Abstract

X Yang, D Gürsoy, C Phatak, V De Andrade, E B Gulsoy, F De Carlo; Learning From Scanning Transmission Electron Microscopy to Enhance Transmission X-ray Mic
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Image and Signal Denoising Methods

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References (4)

Show source-provided references
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3. Stat. Soc. Series B (Methodological) · 1996 · 58 · 26710.1111/j.2517-6161.1996.tb02080.x ↗
4. Nat. Comm. · 2014 · 5 · 335810.1038/ncomms4358 ↗