The Application of Cryogenic Focused Ion Beam Scanning Electron Microscopy to Hydrogel Characterization.
Source abstract
Abstract
Christopher Parmenter, Abdulraman Baki, Kevin M Shakesheff; The Application of Cryogenic Focused Ion Beam Scanning Electron Microscopy to Hydrogel Characte
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (2)
Show source-provided references
1. Biotech and Bioengineering · 2013 · 110 · 328
2. 10.1111/j.1365-2818.2006.01567.x10.1111/j.1365-2818.2006.01567.x ↗