Can EBSD Patterns Be Used for Determination of Grain Boundary Inclination?
Source abstract
Abstract
Michael Chapman, Saransh Singh, Marc De Graef; Can EBSD Patterns Be Used for Determination of Grain Boundary Inclination?, Microscopy and Microanalysis, Vo
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications
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References (2)
Show source-provided references
1. 1995 · 2510.1093/oso/9780195088748.003.0003 ↗
2. 10.1017/S143192761300184010.1017/S1431927613001840 ↗