Improving Analytical Efficiency of EDS using a Newly-designed X-ray Detecting System for Aberration Corrected 300 kV Microscope
Source abstract
Abstract
Takeo Sasaki, Hidetaka Sawada, Eiji Okunishi, Yu Jimbo, Yorinobu Iwasawa, Koji Miyatake, Shuichi Yuasa, Toshikatsu Kaneyama; Improving Analytical Efficienc
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advancements in Photolithography Techniques · Advanced X-ray Imaging Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (2)
Show source-provided references
1. 10.1017/S143192761400748X10.1017/S143192761400748X ↗
2. Microsc. Microanal. · 2014 · 20 · 124