journal article·2016-07Open access

Design of an Ultra-High Resolution SEM for Enhanced Analysis

Jaroslav Jiruse, Miloslav Havelka, Jan Polster

Microscopy and Microanalysis· Volume 22· Issue S3

Abstract

Jaroslav Jiruse, Miloslav Havelka, Jan Polster; Design of an Ultra-High Resolution SEM for Enhanced Analysis, Microscopy and Microanalysis, Volume 22, Issu
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · Advanced Electron Microscopy Techniques and Applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (4)

Show source-provided references
1. Ultramicroscopy · 2014 · 146
2. Imaging & Microscopy · 2015 · 34
3. Microsc. Microanal · 2013 · 19 · 130210.1017/S1431927613008507 ↗
4. 10.1063/1.114054110.1063/1.1140541 ↗