Nanoplasmonics in the TEM
Source abstract
Abstract
This paper reviews recent developments in scanning TEM (STEM)-based characterization of localized surface plasmons. It will be shown that localized surface plasmon resonances can be mapped with STEM cathodoluminescence as well as with monochromated electron energy-loss spectroscopy (EELS) The spectral and spatial resolution of the techniques will be discussed, and examples will be given that demonstrate the unique capability of STEM-based plasmon analysis in comparison with other experimental techniques.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Anodic Oxide Films and Nanostructures · Advanced Materials Characterization Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (15)
Show source-provided references
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