Using Electron Diffraction Techniques, CBED and N-PED to measure Strain with High Precision and High Spatial Resolution

J.L. Rouviere; Y. Martin; N. Bernier; M. Vigouroux; D. Cooper; J.M. Zuo

doi:10.1017/s1431927615011824

journal article·2015-08Open access

Using Electron Diffraction Techniques, CBED and N-PED to measure Strain with High Precision and High Spatial Resolution

J.L. Rouviere, Y. Martin, N. Bernier, M. Vigouroux, D. Cooper, J.M. Zuo

Microscopy and Microanalysis· Volume 21· Issue S3

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Abstract

JL Rouviere, Y Martin, N Bernier, M Vigouroux, D Cooper, JM Zuo; Using Electron Diffraction Techniques, CBED and N-PED to measure Strain with High Precisio

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Source: openalex_inverted_index · Quality: short

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OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Non-Destructive Testing Techniques · Silicon Carbide Semiconductor Technologies

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References (3)

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3. 10.1063/1.482915410.1063/1.4829154 ↗