Ultra High Energy Resolution EELS Mapping using Aberration-corrected Low-voltage STEM Equipped with Monochromator
Source abstract
Abstract
Masaki Mukai, Shigeyuki Morishita, Hidetaka Sawada, Kazu Suenaga; Ultra High Energy Resolution EELS Mapping using Aberration-corrected Low-voltage STEM Equ
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
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References (2)
Show source-provided references
1. 10.1016/j.ultramic.2014.02.00410.1016/j.ultramic.2014.02.004 ↗
2. 10.1093/jmicro/dfp03310.1093/jmicro/dfp033 ↗