Automated Image Processing Scheme to Measure Atomic-Scale Structural Fluctuations
Source abstract
Abstract
Zahra Hussaini, Pin Ann Lin, Wenhui Zhu, Bharath Natarajan, Renu Sharma; Automated Image Processing Scheme to Measure Atomic-Scale Structural Fluctuations,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Advanced Electron Microscopy Techniques and Applications · Ion-surface interactions and analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. 10.1016/j.ultramic.2014.11.02310.1016/j.ultramic.2014.11.023 ↗
2. Res · 2005 · 20 · 1695
3. 10.1126/science.106439910.1126/science.1064399 ↗