Correlative Analysis using FIB-ToF-SIMS and Atom Probe Tomography on Geological Materials
Source abstract
Abstract
William DA Rickard, Steven M Reddy, David W Saxey, Denis Fourgerouse, Arie van Riessen; Correlative Analysis using FIB-ToF-SIMS and Atom Probe Tomography o
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. Nature Communication · 2016 · 7 · 1
2. 10.1080/10739149.2013.87884310.1080/10739149.2013.878843 ↗
3. 10.1038/ngeo207510.1038/ngeo2075 ↗