Stereological Techniques for Quantitative Characterization of Microstructures
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Abstract
Journal Article Stereological Techniques for Quantitative Characterization of Microstructures Get access Arun M Gokhale Arun M Gokhale Professor of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30062, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 1966–1967, https://doi.org/10.1017/S1431927616010679 Published: 25 July 2016
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Research context
OpenAlex topics: Advanced X-ray Imaging Techniques · Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques
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References (17)
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