journal article·2016-07Open access

Recent Applications of Sub-20 meV Monochromated STEM-EELS: from Phonon to Core Losses in Real and Momentum Spaces

Q.M. Ramasse, F.S. Hage, D.M. Kepaptsoglou, P. Abellan, J. Yates, R.J. Nicholls, H.C. Nerl, V. Nicolosi, K. Winther, K. Thygesen, P.Z. El Khoury, W.P. Hess, F. Azough, R. Freer

Microscopy and Microanalysis· Volume 22· Issue S3

Abstract

QM Ramasse, FS Hage, DM Kepaptsoglou, P Abellan, J Yates, RJ Nicholls, HC Nerl, V Nicolosi, K Winther, K Thygesen, PZ El Khoury, WP Hess, F Azough, R Freer
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis

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References (4)

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