Recent Applications of Sub-20 meV Monochromated STEM-EELS: from Phonon to Core Losses in Real and Momentum Spaces
Source abstract
Abstract
QM Ramasse, FS Hage, DM Kepaptsoglou, P Abellan, J Yates, RJ Nicholls, HC Nerl, V Nicolosi, K Winther, K Thygesen, PZ El Khoury, WP Hess, F Azough, R Freer
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. Microsc. Microanal. · 2015 · 21 · 146910.1017/S1431927615008120 ↗
2. 10.1103/PhysRevLett.80.472910.1103/PhysRevLett.80.4729 ↗
3. Microsc. Microanal · 1998 · 20 · 1246
4. 10.1098/rsta.2009.008710.1098/rsta.2009.0087 ↗