Dark-Field Imaging based on Post-Processing of Electron Backscatter Diffraction Patterns in a Scanning Electron Microscope
Source abstract
Abstract
Nicolas Brodusch, Hendrix Demers, Raynald Gauvin; Dark-Field Imaging based on Post-Processing of Electron Backscatter Diffraction Patterns in a Scanning El
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Photocathodes and Microchannel Plates · Advanced Electron Microscopy Techniques and Applications
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