Sample Tilt Effects on Atom Column Position Determination in ABF-STEM Imaging
Source abstract
Abstract
Dan Zhou, Knut Müller-Caspary, Wilfried Sigle, Florian F Krause, Andreas Rosenauer, Peter A van Aken; Sample Tilt Effects on Atom Column Position Determina
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electronic and Structural Properties of Oxides · Force Microscopy Techniques and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. 10.1002/adfm.20130147010.1002/adfm.201301470 ↗
2. 10.1017/S143192760909389110.1017/S1431927609093891 ↗
3. Appl Phys Lett · 2009 · 95