Nano-Particle TEM Sample Preparation Primer
Source abstract
Abstract
Olivia Vierrether, Jessica TerBush, Clarissa Wisner; Nano-Particle TEM Sample Preparation Primer, Microscopy and Microanalysis, Volume 22, Issue S3, 1 July
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
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References (1)
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1. 10.1080/1478643060077632210.1080/14786430600776322 ↗