Improved Data Analysis and Reconstruction Methods for STEM-EDX Tomography

Zineb Saghi; Joshua Einsle; Roberts Blukis; Ansis Strodahs; Rowan Leary; Pierre Burdet; Richard Harrison; Paul Midgley

doi:10.1017/s1431927616002270

journal article·2016-07Open access

Improved Data Analysis and Reconstruction Methods for STEM-EDX Tomography

Zineb Saghi, Joshua Einsle, Roberts Blukis, Ansis Strodahs, Rowan Leary, Pierre Burdet, Richard Harrison, Paul Midgley

Microscopy and Microanalysis· Volume 22· Issue S3

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Abstract

Zineb Saghi, Joshua Einsle, Roberts Blukis, Ansis Strodahs, Rowan Leary, Pierre Burdet, Richard Harrison, Paul Midgley; Improved Data Analysis and Reconstr

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OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques

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