In Situ Biasing TEM Characterization of Resistive Switching Phenomena in TiO2-based RRAM
Source abstract
Abstract
Jonghan Kwon, Abhishek A Sharma, James A Bain, Yoosuf N Picard, Marek Skowronski; In Situ Biasing TEM Characterization of Resistive Switching Phenomena in
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Memory and Neural Computing · Ferroelectric and Negative Capacitance Devices · Machine Learning and ELM
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