A Comparison of Oxide Thickness Measurements of Uranium Dioxide and Tantalum Pentoxide Using Both User-Acquired and Built-In EDS Standards
Source abstract
Abstract
C Poulter, C Lang; A Comparison of Oxide Thickness Measurements of Uranium Dioxide and Tantalum Pentoxide Using Both User-Acquired and Built-In EDS Standar
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Non-Destructive Testing Techniques · Electron and X-Ray Spectroscopy Techniques · Surface Roughness and Optical Measurements
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