The SECOM Platform: an Integrated CLEM Solution
Source abstract
Abstract
SV den Hoedt, APJ Effting, MT Haring; The SECOM Platform: an Integrated CLEM Solution, Microscopy and Microanalysis, Volume 20, Issue S3, 1 August 2014, Pa
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electrowetting and Microfluidic Technologies · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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