X-ray Mapping and Chemical Phase Mapping with an Amptek SDD
Source abstract
Abstract
L Moran, K Moran, R Wuhrer; X-ray Mapping and Chemical Phase Mapping with an Amptek SDD, Microscopy and Microanalysis, Volume 20, Issue S3, 1 August 2014,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: X-ray Diffraction in Crystallography · Nuclear Physics and Applications · Advanced X-ray Imaging Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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