journal article·2014-08Open access

Atomic-Resolution Scanning Transmission Electron Microscopy with Segmented Annular All Field Detector

N. Shibata, S.D. Findlay, Y. Ikuhara

Microscopy and Microanalysis· Volume 20· Issue S3

Abstract

N Shibata, SD Findlay, Y Ikuhara; Atomic-Resolution Scanning Transmission Electron Microscopy with Segmented Annular All Field Detector, Microscopy and Mic
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques

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