Sensitivity of an Atomic Force Microscope Cantilever with a Crack
Source abstract
Abstract
Haw-Long Lee, Yu-Ching Yang, Win-Jin Chang; Sensitivity of an Atomic Force Microscope Cantilever with a Crack, Microscopy and Microanalysis, Volume 20, Iss
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis · Advanced Materials Characterization Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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