journal article·2014-08Open access

Overview of Commercially Available CEOS Hexapole-type Aberration Correctors

Heiko Müller, Stephan Uhlemann, Peter Hartel, Joachim Zach, Max Haider

Microscopy and Microanalysis· Volume 20· Issue S3

Abstract

Heiko Müller, Stephan Uhlemann, Peter Hartel, Joachim Zach, Max Haider; Overview of Commercially Available CEOS Hexapole-type Aberration Correctors, Micros
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Fluorescence Microscopy Techniques · Advanced X-ray Imaging Techniques

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References

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