Automated SEM Analysis in Industrial Process Control and Scientific Research
Source abstract
Abstract
C Lang, A Hyde, Matthew Hiscock, S Burgess, J Holland, P Statham; Automated SEM Analysis in Industrial Process Control and Scientific Research, Microscopy
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Machine Learning in Materials Science
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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