On Proper Phase Contrast Imaging in Aberration Corrected TEM
Source abstract
Abstract
Peter Hartel, Martin Linck, Frank Kahl, Heiko Müller, Max Haider; On Proper Phase Contrast Imaging in Aberration Corrected TEM, Microscopy and Microanalysi
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced X-ray Imaging Techniques
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References
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