journal article·2012-07

A ‘tulip aperture’ providing in-focus phase-contrast

B. Buijsse, F. Van Laarhoven, A.K. Schmid, R. Cambie, S. Cabrini, J. Jin, R.M. Glaeser

Microscopy and Microanalysis· Volume 18· Issue S2
Publisher page

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Advanced X-ray Imaging Techniques · Advanced Electron Microscopy Techniques and Applications · Ion-surface interactions and analysis

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References

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