Simulation for the Development of Electron Guns and Detection Systems of Modern Field Emission Scanning Electron Microscopes
Source abstract
Abstract
Yoichi Ose, Hirofumi Sato, Hideo Morishita, Teruo Kohashi; Simulation for the Development of Electron Guns and Detection Systems of Modern Field Emission S
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (10)
Show source-provided references
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