Sub-Angstrom Probe Size in HADF-STEM at 120KV
Source abstract
Abstract
PE Batson, N Dellby, OL Krivanek; Sub-Angstrom Probe Size in HADF-STEM at 120KV, Microscopy and Microanalysis, Volume 8, Issue S02, 1 August 2002, Pages 14
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis
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