Benefits and Possibilities of Cc–Correction for TEM / STEM
Source abstract
Abstract
Heiko Mülle, Stephan Uhlemann, Maximilian Haider; Benefits and Possibilities of Cc–Correction for TEM / STEM, Microscopy and Microanalysis, Volume 8, Issue
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Genetics, Bioinformatics, and Biomedical Research
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
Reference metadata was not supplied for this record.