Characterization of Boron Containing Graphite Using TEM and EELS
Source abstract
Abstract
JS Kim, SJ Kim, GH Kim, CH Chun, H.H. Koo; Characterization of Boron Containing Graphite Using TEM and EELS, Microscopy and Microanalysis, Volume 8, Issue
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Boron and Carbon Nanomaterials Research · Graphite, nuclear technology, radiation studies · Electron and X-Ray Spectroscopy Techniques
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References
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