In Situ Observations Using Ultrahigh Vacuum Scanning Electron Microscopy
Source abstract
Abstract
Journal Article In Situ Observations Using Ultrahigh Vacuum Scanning Electron Microscopy Get access Y Homma Y Homma NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, Atsugi, Kanagawa 243-0198, Japan Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 9, Issue S02, 1 August 2003, Pages 910–911, https://doi.org/10.1017/S1431927603444553 Published: 01 August 2003
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques
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References
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