In-Situ Lift-Out FIB Specimen Preparation for TEM of Magnetic Materials
Source abstract
Abstract
BW Kempshall, LA Giannuzzi; In-Situ Lift-Out FIB Specimen Preparation for TEM of Magnetic Materials, Microscopy and Microanalysis, Volume 8, Issue S02, 1 A
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Surface Polishing Techniques · Microstructure and mechanical properties · Non-Destructive Testing Techniques
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