High-Resolution Phase-Contrast Imaging at XFELs

A. Schropp; R. Hoppe; V. Meier; J. Patommel; F. Seiboth; Hae Ja Lee; B. Nagler; E.C Galti er; B. Arnol d; J.B. Hastings; C.G.S chroer

doi:10.1017/s1431927615011617

journal article·2015-08

High-Resolution Phase-Contrast Imaging at XFELs

A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, Hae Ja Lee, B. Nagler, E.C Galti er, B. Arnol d, J.B. Hastings, C.G.S chroer

Microscopy and Microanalysis· Volume 21· Issue S3

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Abstract

A Schropp, R Hoppe, V Meier, J Patommel, F Seiboth, Hae Ja Lee, B Nagler, EC Galti er, B Arnol d, JB Hastings, CGS chroer; High-Resolution Phase-Contrast I

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced X-ray Imaging Techniques · Advanced Electron Microscopy Techniques and Applications · Laser-Plasma Interactions and Diagnostics

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (5)

Show source-provided references

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4. 10.1117/12.202478410.1117/12.2024784 ↗

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