Limits of Specimen Thickness for Energy-Filtered Tomography of Stained Plastic Sections at 120 kV Beam Voltage
Source abstract
Abstract
E Kocsis, A Weisberg, B Moss, X Chen, TS Reese, RD Leapman; Limits of Specimen Thickness for Energy-Filtered Tomography of Stained Plastic Sections at 120
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced X-ray and CT Imaging · Electrical and Bioimpedance Tomography · Mineral Processing and Grinding
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