Aberration Corrected High Angle Annular Dark Field (HAADF) Scanning Transmission Electron Microscopy (STEM) and In Situ Transmission Electron Microscopy (TEM) Study of Transition Metal Dichalcogenides (TMDs)
Source abstract
Abstract
Jinguo Wang, Ning Lu, Juan Pablo Oviedo, Xin Peng, Guoda Lian, Moon J Kim; Aberration Corrected High Angle Annular Dark Field (HAADF) Scanning Transmission
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: 2D Materials and Applications · Chalcogenide Semiconductor Thin Films · Quantum Dots Synthesis And Properties
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References (3)
Show source-provided references
1. ACS Nano · 2015
2. 10.1103/RevModPhys.81.10910.1103/RevModPhys.81.109 ↗
3. 10.1038/nnano.2012.19310.1038/nnano.2012.193 ↗