journal article·2012-07

Twin Boundary Defect Structure in Bismuth Telluride

D.L. Medlin, N.Y. Yang

Microscopy and Microanalysis· Volume 18· Issue S2
Publisher page

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Inorganic Chemistry and Materials · Advanced Semiconductor Detectors and Materials · Chalcogenide Semiconductor Thin Films

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References

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