journal article·2012-07

Photoluminescence Properties And TEM Characterization Of Europium Doped Silicate Oxyapatite Sr2Y8(SiO4)6O2

Z. Dong, Y. Shen

Microscopy and Microanalysis· Volume 18· Issue S2
Publisher page

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Luminescence Properties of Advanced Materials · Crystal Structures and Properties · Radiation Detection and Scintillator Technologies

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References

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